PB038B570B-25A IC Test Probe, 0.22 mm Plunger

Specification	Details
Overall Length	5.70 ±0.15 mm
Plunger Diameter	0.22 ±0.01 mm
Rated Current	2.0A
Contact Resistance	≤100 mΩ
Spring Force	24.5 gf ±20%
Working Stroke	0.80 mm full, 0.65 mm working
Temperature Range	−40°F–185°F
Durability	≥100,000 cycles

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Higher-current IC test probe rated at 2.0A with a 0.22 mm plunger diameter. Delivers stable contact resistance below 100 mΩ through 100,000+ cycles. The wider plunger handles power delivery lines on IC packages that carry heavier loads during test.

Length : 5.70 ±0.15 mm

Plunger Ø : 0.22 ±0.01 mm

Current : 2.0A

Resistance : ≤100 mΩ

Spring Force : 24.5 gf ±20%

Stroke : 0.80 mm full, 0.65 mm working

Temp Range : −40°F–185°F

Durability : ≥100,000 cycles

Rated Current	2.0A
Contact Resistance	≤100 mΩ
Spring Force	24.5 gf ±20%

PB038B570B-25A IC Test Probe, 0.22 mm Plunger

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